DocumentCode
3009381
Title
MEG Adaptive Noise Suppression using Fast LMS
Author
Ahmar, Nayef E. ; Simon, Jonathan Z.
Author_Institution
Dept. of Electr. & Comput. Eng., Maryland Univ., College Park, MD
fYear
2005
fDate
16-19 March 2005
Firstpage
29
Lastpage
32
Abstract
Magnetoencephalography (MEG) measures magnetic fields generated by electric currents in the brain, non-invasively and with millisecond temporal resolution. Typical signals are 10-13 T, so noise contamination due to external magnetic fields is a serious concern. Digital signal processing is typically required in addition to magnetic shielding. Using three reference channels, displaced from the head, to measure the noise, we apply adaptive filtering to subtract out estimates of the noise, via the block least-mean-square ("fast LMS") method. The algorithm is tested by its effects on the number and distribution of channels which have statistically significant signals (distinguishable from background noise at a specified false-positive rate). We show that fast LMS both increases the number significant channels and reduces the variance of false positives
Keywords
adaptive filters; adaptive signal processing; bioelectric phenomena; biomedical measurement; least mean squares methods; magnetoencephalography; medical signal processing; neurophysiology; random noise; statistical analysis; 10 to 13 T; MEG; MEG adaptive noise suppression; adaptive filtering; block least-mean-square method; brain; channel distribution; digital signal processing; electric currents; external magnetic fields; fast LMS; magnetic shielding; magnetoencephalography; millisecond temporal resolution; noise contamination; noninvasive magnetic field measurement; Contamination; Current measurement; Electric variables measurement; Least squares approximation; Magnetic field measurement; Magnetic noise; Magnetic shielding; Magnetoencephalography; Pollution measurement; Signal resolution;
fLanguage
English
Publisher
ieee
Conference_Titel
Neural Engineering, 2005. Conference Proceedings. 2nd International IEEE EMBS Conference on
Conference_Location
Arlington, VA
Print_ISBN
0-7803-8710-4
Type
conf
DOI
10.1109/CNE.2005.1419543
Filename
1419543
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