DocumentCode :
3009457
Title :
How image processing can push electron microscopy to its limits
Author :
Van Dyck, Dirk ; de Beeck, Marc Op
Author_Institution :
Antwerp Univ., Belgium
Volume :
3
fYear :
1995
fDate :
23-26 Oct 1995
Firstpage :
41
Abstract :
The factors limiting the resolution in high resolution electron microscopy are discussed. It is shown that electron microscopy is approaching its physical limits which are not limited anymore by the instrument but rather by the object. The problem however is how to extract the information from the images so as to fully exploit the resolution capabilities. Since the visualisation of individual atoms becomes possible, we can reconsider the concept of resolution in terms of information theory. New promising developments towards direct retrieval of the object information by processing of the electron images are discussed. These include solutions to the phase problem as well as inversion of the dynamical diffraction in the object. Finally, results are shown, which demonstrate the potential of this approach
Keywords :
electron diffraction; electron microscopy; image resolution; information retrieval; information theory; nondestructive testing; dynamical diffraction inversion; electron images; high resolution electron microscopy; image processing; information theory; object information retrieval; phase problem; Data mining; Diffraction; Electron microscopy; Image processing; Image resolution; Image retrieval; Information retrieval; Information theory; Instruments; Visualization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing, 1995. Proceedings., International Conference on
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-7310-9
Type :
conf
DOI :
10.1109/ICIP.1995.537575
Filename :
537575
Link To Document :
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