Title :
LAXTER, a new method for extraction of parasitic effects from MCM layout
Author :
Simsek, Arzu ; Luo, Qiong ; Eder, Alfred
Author_Institution :
Tech. Univ. Berlin, Germany
Abstract :
A new method based on the scan line method and a computer program for extracting parasitic effects from mask layout data have been developed and are integrated in a design environment. This method and the design environment are presented. With this method the coupled lines and the discontinuities among N interconnection lines can be found in time proportional to (N+I)log N, where I is the number of objects to be found. The details of the proposed algorithms and test results are given
Keywords :
circuit layout; circuit layout CAD; integrated circuit interconnections; multichip modules; LAXTER; MCM layout; computer program; coupled lines; design environment; discontinuities; interconnection lines; mask layout data; parasitic effects extraction; scan line method; Analytical models; Crosstalk; Data mining; Design automation; Geometry; Process design; Signal analysis; Signal design; Signal generators; Solid modeling;
Conference_Titel :
ASIC Conference and Exhibit, 1994. Proceedings., Seventh Annual IEEE International
Conference_Location :
Rochester, NY
Print_ISBN :
0-7803-2020-4
DOI :
10.1109/ASIC.1994.404544
