• DocumentCode
    3009842
  • Title

    Laser chip separation method for GaAs MMIC wafers

  • Author

    Wong, E.H. ; Wylie, R.B. ; Johnson, D.R.

  • Author_Institution
    Hewlett-Packard Co., Santa Rosa, CA, USA
  • fYear
    1988
  • fDate
    24-25 May 1988
  • Firstpage
    113
  • Lastpage
    116
  • Abstract
    A chip separation process is described that uses a Nd-YAG laser with the wafer mounted on stretchable tape for machine sort and load for GaAs monolithic microwave integrated circuit (MMIC) wafers. This method is considered especially suitable for prototype masks with multiple-chip design. One of the major advantages of this technique is that the laser can be programmed to cut any pattern desired such that the different circuits need not be laid out in a straight grid pattern as required for sawing. One hundred percent (100%) chip separation yield with no chipping or cracking has been demonstrated. The complete laser chip-separation process consists of eight steps: front scribe alley etch, backside lopping, wafer test, wafer mounting, protective coating for optimal die separation, laser cutting, protective coat removal, and stretch and frame for sorting and chip loading. The process steps are described, and the method´s advantages are noted.<>
  • Keywords
    III-V semiconductors; gallium arsenide; integrated circuit technology; laser beam machining; microwave integrated circuits; monolithic integrated circuits; GaAs; MMIC wafers; Nd:YAG laser; YAG:Nd; YAl5O12:Nd; backside lopping; chip separation yield; front scribe alley etch; laser chip separation method; laser cutting; machine sort and load; multiple-chip design; optimal die separation; protective coat removal; protective coating; prototype masks; stretchable tape; wafer mounting; wafer test; Gallium arsenide; Laser beam cutting; MMICs; Masers; Microwave integrated circuits; Monolithic integrated circuits; Protection; Prototypes; Sawing; Separation processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Millimeter-Wave Monolithic Circuits Symposium, 1988. Digest of Papers., IEEE 1988
  • Conference_Location
    New York, NY, USA
  • Type

    conf

  • DOI
    10.1109/MCS.1988.197302
  • Filename
    197302