DocumentCode
3010037
Title
4 P soldering model for solder joints quality assessment
Author
Svasta, Paul ; Plotog, Loan ; Cucu, Traian ; Vasile, Alexandru ; Marin, Alexandru
Author_Institution
Center for Tehnological Electron. & Interconnection Tech., Politeh. Univ. of Bucharest, Bucharest, Romania
fYear
2009
fDate
13-17 May 2009
Firstpage
1
Lastpage
6
Abstract
The reliability of microelectronics components and assemblies it should be considered as expression of solder joints functionality. The functions are in close connection with the microstructure of the solder joints, which are the result of the soldering Process temperature gradient action over the trinomial solder alloy/Paste, electronic components terminals/Pin and PCBs Pads finishes. Consequently the solder joints quality can be correctly evaluated taking into consideration not only the severally intrinsic parameters of the trinomial elements, Pad-Paste-Pin, but also interrelate the complex reaction at the interface between them and interdependence with the soldering Process parameters. Therefore the solder joints can be considered result of a complex function of 4P elements defined before. In the paper, a 4P Soldering Model will be proposed in order to characterize the solder joints quality, emphasizing dynamics of Pad-Paste-Pin-Process elements synergistically interactions. The different pad finishes (NiAu, ImmAg, ImmSn, HASL, OSP) realized on PCBs having different core material, (FR4, Glass, Al, Cu, Al2O3), the components terminals/pins/balls having different finishes, the different solder paste type and the reflow soldering process (infrared-convection/vapour phase/LASER) with their typically parameters are the 4P Soldering Model variables. Practical experiments were designed in order to study 4P Soldering Model elements, Pad-Paste-Pin-Process, interactions.
Keywords
printed circuits; reliability; soldering; 4 P soldering model; PCB; microelectronics components; microstructure; reflow soldering process; reliability; solder joints; Assembly; Electronic components; Glass; Microelectronics; Microstructure; Optical materials; Quality assessment; Semiconductor device modeling; Soldering; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Technology, 2009. ISSE 2009. 32nd International Spring Seminar on
Conference_Location
Brno
Print_ISBN
978-1-4244-4260-7
Type
conf
DOI
10.1109/ISSE.2009.5206936
Filename
5206936
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