DocumentCode
3010194
Title
Operation and testing of electrostatic microactuators and micromachined sound detectors for active control of high speed flows
Author
Huang, C. ; Najafi, K. ; Alnajjar, E. ; Christophorou, C. ; Naguib, A. ; Nagib, H.M.
Author_Institution
Center for Integrated Sensors & Circuits, Michigan Univ., Ann Arbor, MI, USA
fYear
1998
fDate
25-29 Jan 1998
Firstpage
81
Lastpage
86
Abstract
The operation and testing of a combined microactuator/microsensor system for use in a high speed jet are presented. Electrostatic actuators have been fabricated using a bulk-silicon dissolved-wafer process, and are more than 12 μm in thickness to achieve a large stiffness in the z-direction. The “micro” actuators resonate at a frequency of 5 kHz/14 kHz and an amplitude of >70 μm peak-peak, generate significant disturbances into the “macro” scale jet flow, and survive operation at speeds of >210 m/s. An array of micromachined sound detectors for the detection of onset of jet screech has also been fabricated. The detectors use stress compensated PECVD silicon nitride/oxide membranes together with monocrystalline ion-implanted p++ silicon piezoresistors to achieve high sensitivity. They have a static sensitivity of 1.1 μV/V·Pa with a 2% nonlinearity over an operating pressure range of 10 kPa
Keywords
CVD coatings; acoustic variables measurement; electrostatic devices; elemental semiconductors; flow control; microactuators; microsensors; silicon; testing; 10 kPa; 12 mum; 14 kHz; 210 m/s; 5 kHz; Si; Si dissolved-wafer process; SiN-SiO2; active control; combined microactuator/microsensor system; disturbances; electrostatic actuators; electrostatic microactuators; equivalent circuit; high speed flows; high speed jet; jet screech; macroscale jet flow; micromachined sound detectors; monocrystalline ion-implanted Si piezoresistors; nonlinearity; operating pressure; static sensitivity; stiffness; stress compensated PECVD membranes; testing; z-direction; Biomembranes; Detectors; Electrostatic actuators; Microactuators; Microsensors; Resonant frequency; Sensor arrays; Silicon; Stress; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems, 1998. MEMS 98. Proceedings., The Eleventh Annual International Workshop on
Conference_Location
Heidelberg
ISSN
1084-6999
Print_ISBN
0-7803-4412-X
Type
conf
DOI
10.1109/MEMSYS.1998.659733
Filename
659733
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