• DocumentCode
    3010279
  • Title

    Dynamic Simulation and Testing of the Electrode-Electrolyte Interface of 3-D Stimulating Microelectrodes

  • Author

    Hung, Andy ; Zhou, David ; Greenberg, Robert ; Judy, Jack W.

  • Author_Institution
    Biomedical Eng. IDP, California Univ., Los Angeles, CA
  • fYear
    2005
  • fDate
    16-19 March 2005
  • Firstpage
    179
  • Lastpage
    182
  • Abstract
    Traditional simulations of current distribution for neuralelectrodes have been based on steady-state, resistive-only models that predict severe current crowding at sharp electrode topologies. In contrast, this work presents time-stepping calculations performed with SPICE and ANSYS that can accurately reflect the capacitive behavior of neuralelectrodes. The simulations display that at the electrode-electrolyte interface, the current distribution exhibits a variation of <10%. While current crowding is observed in the solution adjacent to sharp convex edges, the current at these sites is found to be parallel to the electrode surface, and is not expected to contribute to electrode corrosion. Preliminary dissolution studies at 50 muC/cm 2 shows an isometric dissolution pattern, confirming the predicted uniform current density
  • Keywords
    current distribution; electrolytes; microelectrodes; neurophysiology; 3-D stimulating microelectrodes; ANSYS; SPICE; capacitive behavior; current distribution; electrode corrosion; electrode-electrolyte interface; isometric dissolution pattern; neuralelectrodes; time-stepping calculations; uniform current density; Current distribution; Displays; Electrodes; Microelectrodes; Predictive models; Proximity effect; SPICE; Steady-state; Testing; Topology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Engineering, 2005. Conference Proceedings. 2nd International IEEE EMBS Conference on
  • Conference_Location
    Arlington, VA
  • Print_ISBN
    0-7803-8710-4
  • Type

    conf

  • DOI
    10.1109/CNE.2005.1419584
  • Filename
    1419584