Title :
A new methodology for test program set generation and re-housing
Author :
Hanna, James P. ; Horth, Willis J.
Author_Institution :
Rome Lab., Griffis AFB, NY, USA
Abstract :
A methodology for significantly improving the consistency, reliability, and transportability of test program sets (TPSs) is presented. This methodology utilizes the proposed IEEE tester-independent data standards and resource-independent standardized test methods to automate the TPS development process. Automating this process greatly reduces the costs associated with TPS development and provides a highly cost-effective method for re-hosting existing TPSs to new tester environments
Keywords :
automatic programming; automatic testing; software portability; software reliability; standardisation; ATE; IEEE; PCB testing; TPS development; consistency; costs; data standards; re-hosting; reliability; test program set generation; transportability; Automatic testing; Circuit testing; Costs; Laboratories; Life estimation; Life testing; Microelectronics; Power system modeling; Printed circuits; Test equipment;
Conference_Titel :
AUTOTESTCON '91. IEEE Systems Readiness Technology Conference. Improving Systems Effectiveness in the Changing Environment of the '90s, Conference Record.
Conference_Location :
Anaheim, CA
Print_ISBN :
0-87942-576-8
DOI :
10.1109/AUTEST.1991.197563
