Title :
Using integrated diagnostics on automatic test equipment
Author :
Franco, John R., Jr.
Author_Institution :
Harris Corp., Syosset, NY, USA
Abstract :
The author addresses the use of integrated diagnostic tools and techniques as applied to automatic test equipment (ATE) and test program sets (TPSs). The use of the tools provided as part of the integrated diagnostic support system (IDSS), namely, the weapon system testability analyzer (WSTA), the adaptive diagnostic system (ADS), and the use of electronic data delivery for technical documentation, is addressed
Keywords :
automatic test equipment; automatic testing; electronic engineering computing; fault location; military computing; weapons; ATE; adaptive diagnostic system; automatic test equipment; electronic data delivery; integrated diagnostics; technical documentation; test program sets; weapon system testability analyzer; Adaptive systems; Automatic test equipment; Costs; Documentation; Information analysis; Life testing; Procurement; System testing; Test equipment; Weapons;
Conference_Titel :
AUTOTESTCON '91. IEEE Systems Readiness Technology Conference. Improving Systems Effectiveness in the Changing Environment of the '90s, Conference Record.
Conference_Location :
Anaheim, CA
Print_ISBN :
0-87942-576-8
DOI :
10.1109/AUTEST.1991.197571
