The PCB circuit analysis system based on AI

Author

Han, Kyongho ; Watson, Karan L.

Author_Institution

Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA

fYear

1991

fDate

24-26 Sep 1991

Firstpage

399

Lastpage

403

Abstract

A parallel printed circuit board test system with artificial intelligence technique is discussed, and the algorithms for the intragroup test and the intergroup test are described. The basic idea is to read the standard connection status and compare it with the connection status of the test board. The concept of the expert system with the statistical analysis of the fault database is used to reduce the test time. The parallelism also reduces the test time. From the knowledge of the fault data, the fault trend can control activity at the manufacturing site. The test equipment is expandable by adding more controller and pin electronics

Keywords

artificial intelligence; automatic testing; expert systems; printed circuit testing; statistical analysis; AI; PCB circuit analysis; artificial intelligence; expert system; fault database; intergroup test; intragroup test; parallel printed circuit board test; production testing; standard connection status; statistical analysis; test time; Artificial intelligence; Circuit analysis; Circuit faults; Circuit testing; Databases; Electronic equipment manufacture; Expert systems; Printed circuits; Statistical analysis; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON '91. IEEE Systems Readiness Technology Conference. Improving Systems Effectiveness in the Changing Environment of the '90s, Conference Record.

Conference_Location

Anaheim, CA

Print_ISBN

0-87942-576-8

Type

conf

DOI

10.1109/AUTEST.1991.197583

Filename

197583