• DocumentCode
    3010963
  • Title

    Study on optimization of capacitive pressure sensor using coupled mechanical-electric analysis

  • Author

    Ionescu, Ciprian ; Svasta, Paul ; Marghescu, Cristina ; Zarnik, M.S. ; Belavic, Darko

  • Author_Institution
    Center for Technol. Electron. & Interconnection Tech., Univ. Politeh. of Bucharest, Bucharest, Romania
  • fYear
    2009
  • fDate
    13-17 May 2009
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The object of the paper is a pressure sensor realized in thick-film technology developed at ldquoJozef Stefanrdquo Institute. This pressure sensor is also the object of a common project which has the goal to optimize the sensor design acting mainly on layout parameters. Some of the sensor parameters are determined by the LTCC process, for instance the thickness of diaphragm whose thickness is a multiple of foil thickness. The novelty in the proposed paper is the use of specific simulation tools to give an estimate of sensor output characteristics. Using this technique it is possible to optimize the layout and construction of the sensor. The finite-element simulation is used to outline the output characteristic: capacitance versus pressure. This simulation implies the coupled field analysis from mechanical deflection of sensor diaphragm to electrical field quantities, in this case the capacitance. The analysis will take into account beside geometrical parameters the temperature dependence of materials properties. This fact will give a better appreciation of real life behavior of manufactured sensors, and can suggest some specific packaging methods.
  • Keywords
    capacitive sensors; ceramic packaging; diaphragms; finite element analysis; pressure sensors; thick film sensors; Jozef Stefan Institute; LTCC process; capacitive pressure sensor; coupled field analysis; coupled mechanical-electric analysis; diaphragm thickness; electrical field quantity; finite-element simulation; foil thickness; mechanical deflection; optimization; packaging method; sensor diaphragm; thick-film technology; Analytical models; Capacitance; Capacitance-voltage characteristics; Capacitive sensors; Design optimization; Finite element methods; Mechanical sensors; Paper technology; Sensor phenomena and characterization; Thick film sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology, 2009. ISSE 2009. 32nd International Spring Seminar on
  • Conference_Location
    Brno
  • Print_ISBN
    978-1-4244-4260-7
  • Type

    conf

  • DOI
    10.1109/ISSE.2009.5206986
  • Filename
    5206986