Title :
A new approach to ATE power
Author_Institution :
Hewlett Packard, Rockaway, NJ, USA
Abstract :
An approach to ATE power to improve the configurability, maintainability, reliability and functionality of the DC power subsystem has been developed. A description of the evolution of DC programmable power, the characteristics of the power subsystem architecture, and how it addresses the need for high-density, high-performance modern ATE is presented
Keywords :
automatic test equipment; power supplies to apparatus; reliability; ATE power; DC power subsystem; DC programmable power; calibration; configurability; functionality; maintainability; reliability; Automatic testing; Circuit testing; Maintenance; Microcomputers; Modems; Monitoring; Power supplies; System testing; Voltage; Voltmeters;
Conference_Titel :
AUTOTESTCON '91. IEEE Systems Readiness Technology Conference. Improving Systems Effectiveness in the Changing Environment of the '90s, Conference Record.
Conference_Location :
Anaheim, CA
Print_ISBN :
0-87942-576-8
DOI :
10.1109/AUTEST.1991.197588
