DocumentCode
3010967
Title
A new approach to ATE power
Author
Kenny, John
Author_Institution
Hewlett Packard, Rockaway, NJ, USA
fYear
1991
fDate
24-26 Sep 1991
Firstpage
425
Lastpage
433
Abstract
An approach to ATE power to improve the configurability, maintainability, reliability and functionality of the DC power subsystem has been developed. A description of the evolution of DC programmable power, the characteristics of the power subsystem architecture, and how it addresses the need for high-density, high-performance modern ATE is presented
Keywords
automatic test equipment; power supplies to apparatus; reliability; ATE power; DC power subsystem; DC programmable power; calibration; configurability; functionality; maintainability; reliability; Automatic testing; Circuit testing; Maintenance; Microcomputers; Modems; Monitoring; Power supplies; System testing; Voltage; Voltmeters;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '91. IEEE Systems Readiness Technology Conference. Improving Systems Effectiveness in the Changing Environment of the '90s, Conference Record.
Conference_Location
Anaheim, CA
Print_ISBN
0-87942-576-8
Type
conf
DOI
10.1109/AUTEST.1991.197588
Filename
197588
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