• DocumentCode
    3011
  • Title

    An Integrated CMOS Passive Self-Interference Mitigation Technique for FDD Radios

  • Author

    Tong Zhang ; Suvarna, Apsara Ravish ; Bhagavatula, Venumadhav ; Rudell, Jacques Christophe

  • Author_Institution
    Electr. Eng. Dept., Univ. of Washington, Seattle, WA, USA
  • Volume
    50
  • Issue
    5
  • fYear
    2015
  • fDate
    May-15
  • Firstpage
    1176
  • Lastpage
    1188
  • Abstract
    This paper presents an integrated passive self-interference mitigation (SIM) technique for FDD radios. A Four Port Canceller (FPC) serves a dual function as a receiver input matching network, and provides an auxiliary path from the transmitter (TX) to the receiver (RX) to perform leakage cancellation, with minimal penalty on the RX noise figure (NF), and power consumption. An example of this technique is applied to the design of a WCDMA front-end consisting of a low noise amplifier (LNA), the FPC, and an emulated power amplifier (PA) in a 40 nm, 6-metal-layer TSMC CMOS process. With proper tuning of the FPC and the use of an off-chip +30 dBm power amplifier, greater than 20 dB of TX leakage suppression is achieved over a cancellation bandwidth of 5 MHz.
  • Keywords
    CMOS integrated circuits; code division multiple access; interference suppression; low noise amplifiers; radio receivers; radio transmitters; radiofrequency interference; radiofrequency power amplifiers; FDD radios; FPC; LNA; NF; PA; RX noise figure; SIM technique; TX; WCDMA front-end; bandwidth 5 MHz; four port canceller; frequency division duplexing; integrated TSMC CMOS passive self-interference mitigation technique; leakage cancellation; low noise amplifier; power amplifier; power consumption; receiver input matching network; transmitter; wideband code division multiple access; Couplings; Multiaccess communication; Noise; Receivers; Spread spectrum communication; Transceivers; Tuning; Fully passive; SAW-less transceivers; Wideband Code Division multiple access (WCDMA); interference suppression; transmitter leakage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2015.2408324
  • Filename
    7069188