Title :
Design criteria for CAE-to-ATE translation
Author :
Benetazzo, L. ; Costella, J. ; Narduzzi, C. ; Offelli, C. ; Rossetto, D.
Author_Institution :
Dipartimento di Elettronica e Inf., Padova Univ., Italy
Abstract :
The development and performance of two translation methods that connect, and integrate the CAE and ATE environments are discussed. The objective is the automatic translation of the information achieved by CAE design simulation procedures into a program that can be directly input to the test equipment for device-under-test (DUT) stimulus and response verification. The authors show how a set of commands for the tester is automatically generated, improving systems integration and robustness in DUT verification
Keywords :
CAD/CAM; automatic test equipment; electronic engineering computing; electronic equipment testing; program interpreters; programming environments; ATE environments; CAE design simulation; CAE-to-ATE translation; DUT verification; device-under-test; stimulus and response verification; Analytical models; Automatic control; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Computer aided engineering; Logic testing; System testing; Timing;
Conference_Titel :
AUTOTESTCON '91. IEEE Systems Readiness Technology Conference. Improving Systems Effectiveness in the Changing Environment of the '90s, Conference Record.
Conference_Location :
Anaheim, CA
Print_ISBN :
0-87942-576-8
DOI :
10.1109/AUTEST.1991.197591
