DocumentCode
3011505
Title
A Novel High-Temperature Planar Package for SiC Multi-Chip Phase-Leg Power Module
Author
Ning, Puqi ; Lei, Thomas G. ; Wang, Fred ; Lu, Guo-Quan ; Ngo, Khai D T
Author_Institution
Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA
fYear
2009
fDate
15-19 Feb. 2009
Firstpage
2061
Lastpage
2067
Abstract
This work presents the design, development and testing of a phase-leg power module packaged by a novel planar packaging technique for high temperature (250degC) operation. Nano-silver paste is chosen as the die-attach material as well as playing the key functions of electrically connecting the devices´ pads. The electrical characteristics of the SiC-based power semiconductors, SiC JFETs and SiC diodes, have been measured and compared before and after packaging. No significant changes are found in the characteristics of all the devices. Prototype module is fabricated and operated up to 400 V, 1.4 kW at junction temperature of 250degC in the continuous power test. Thermo-mechanical reliability has also been investigated by passive cycling the module from -55degC to 250degC. Electrical and mechanical performances of the packaged module are characterized and considered to be reliable for at least 200 cycles.
Keywords
junction gate field effect transistors; multichip modules; power semiconductor diodes; semiconductor device reliability; semiconductor device testing; silicon compounds; wide band gap semiconductors; JFET; die-attach material; diodes; high-temperature planar package; multichip phase-leg power module; passive cycling; power 1.4 kW; power semiconductors; temperature 250 degC; thermo-mechanical reliability; voltage 400 V; Electric variables; Joining processes; Multichip modules; Nanoscale devices; Phase change materials; Semiconductor device packaging; Semiconductor materials; Silicon carbide; Temperature; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition, 2009. APEC 2009. Twenty-Fourth Annual IEEE
Conference_Location
Washington, DC
ISSN
1048-2334
Print_ISBN
978-1-4244-2811-3
Electronic_ISBN
1048-2334
Type
conf
DOI
10.1109/APEC.2009.4802958
Filename
4802958
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