DocumentCode :
3011698
Title :
Investigation of the pulse load behavior of power wire-wound resistors
Author :
Nicolics, Johann ; Fasching, Martin
Author_Institution :
Inst. of Sensor & Actuator Syst., Vienna Univ. of Technol., Vienna, Austria
fYear :
2009
fDate :
13-17 May 2009
Firstpage :
1
Lastpage :
5
Abstract :
A long-term resistance drift of wire-wound resistors or even a failure is frequently caused by short but repeated temperature peaks during pulse load operation. In this paper this aspect is investigated by comparison of two types of power wire-wound resistors with identical resistance value, nominal power, and size, but significantly different thermal behavior under pulse load condition. In order to capture the thermal cause as directly as possible a specific measuring circuit was developed to record the temperature as a function of time in the resistor wire during the dynamic cooling phase immediately after a pulse. In this way a peak temperature of e.g. 405degC was observed in one resistor type whereas the peak temperature in the other one at the same pulse load condition exceeded even 1000degC which is undoubtedly detrimental if periodically repeated. The measuring principle is presented in detail. The measuring accuracy is estimated and its meaning for the interpretation of the obtained results is shown. Based on these results the dependence of the pulse load resistivity of a wire-wound resistor on its interior structure is discussed. It is demonstrated that the pulse load performance can be improved significantly by increasing the thermal capacitance of the resistor wire without increasing the resistor size.
Keywords :
power electronics; reliability; resistors; measuring accuracy; power wire-wound resistors; pulse load condition; pulse load resistivity; resistance; thermal capacitance; Circuits; Electrical resistance measurement; Phase measurement; Pulse measurements; Resistors; Temperature; Thermal loading; Thermal resistance; Time measurement; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Technology, 2009. ISSE 2009. 32nd International Spring Seminar on
Conference_Location :
Brno
Print_ISBN :
978-1-4244-4260-7
Type :
conf
DOI :
10.1109/ISSE.2009.5207023
Filename :
5207023
Link To Document :
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