Title :
Development of measurement system for secondary electron emission yield of insulating materials for spacecraft materials
Author :
Shibuya, Kazuhiko ; Nomura, Keigo ; Miyake, Hirokazu ; Tanaka, Yuichi ; Ohira, Masao ; Okumura, Takashi ; Takahashi, Masaharu
Author_Institution :
Meas. & Electr. Machine Control Lab., Tokyo City Univ., Tokyo, Japan
Abstract :
We studied how to measure the secondary electron emission (SEE) of metal and insulating materials used for satellite thermal insulation or other such purposes. SEE yield measurement is very important for analyzing charge accumulation on the satellite surfaces due to the space environment because electron emission for irradiated electrons influences the amount of surface charge. Therefore, we are developing the measurement system without the deceleration voltage and enable to obtain the characteristics of the SEE yield from insulation materials irradiated by an electron beam with energy of 300 eV to 5 keV. This report introduces the developed measurement system and the SEE yield measurement results of metal sample and Polymer (polyimide and FEP). From those results, we discuss the characteristics of SEE that depend on each material. Furthermore, we also propose a future plan of SEE measurement for satellite materials.
Keywords :
aerospace instrumentation; aerospace materials; artificial satellites; electron beam effects; measurement systems; secondary electron emission; thermal insulating materials; FEP; SEE yield measurement; charge accumulation; electron beam irradiation; electron volt energy 300 eV to 5 keV; insulating materials; measurement system; polyimide; satellite surface; satellite thermal insulation; secondary electron emission yield; space environment; spacecraft materials; Current measurement; Electron emission; Extraterrestrial measurements; Gold; Materials; Satellites; Secondary Electron Emission; Spacecraft Charging;
Conference_Titel :
Condition Monitoring and Diagnosis (CMD), 2012 International Conference on
Conference_Location :
Bali
Print_ISBN :
978-1-4673-1019-2
DOI :
10.1109/CMD.2012.6416350