Title :
Negative Electron Affinity Based Vacuum Microelectronics Devices
Author :
Santos, EdvaI J P ; MacDonald, Noel C.
Author_Institution :
Cornell University
Keywords :
Cathodes; Electrodes; Electron emission; Lenses; Microelectronics; Microoptics; Nanofabrication; Silicon compounds; Testing; Vacuum technology;
Conference_Titel :
Vacuum Microelectronics Conference, 1993., Proceedings of IEEE 6th International
Print_ISBN :
0-7803-0852-2
DOI :
10.1109/IVMC.1993.700333