DocumentCode :
3012611
Title :
Terahertz apertureless near-field microscopy of a vanadium dioxide thin film
Author :
Zhan, Hui ; Hvasta, Michael ; Astley, Victoria ; Deibel, Jason A. ; Mittleman, Daniel M. ; Lim, Y.
Author_Institution :
Rice Univ., Houston
fYear :
2007
fDate :
6-11 May 2007
Firstpage :
1
Lastpage :
2
Abstract :
We report the application of terahertz apertureless near-field microscopy to vanadium dioxide thin films. We observe an enhancement of the terahertz amplitude due to the metal-insulator transition induced by an applied voltage.
Keywords :
metal-insulator transition; near-field scanning optical microscopy; thin films; vanadium compounds; VO2; metal-insulator transition; terahertz amplitude; terahertz apertureless near-field microscopy; vanadium dioxide thin film; Frequency; Metal-insulator structures; Microscopy; Optical films; Optical scattering; Semiconductivity; Temperature; Transistors; Ultrafast optics; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2007. CLEO 2007. Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-55752-834-6
Type :
conf
DOI :
10.1109/CLEO.2007.4453028
Filename :
4453028
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3012611
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