A simple technique for the measurement of the permittivity of medium loss samples using cavity perturbation method

Author

Banerjee, Prasun ; Ghosh, Gautam ; Biswas, Salil Kumar

Author_Institution

Dept. of Phys., Univ. Coll. of Sci., Kolkata

fYear

2007

fDate

19-20 Dec. 2007

Firstpage

1

Lastpage

3

Abstract

The cavity perturbation method is widely used in the study of electromagnetic properties of dielectric materials at X-band frequencies. It works well for the measurement of low-loss and medium loss materials. In this paper an easy and reliable method is discussed for the accurate determination of the dielectric constant of medium loss samples such as Teflon and Perspex.

Keywords

dielectric loss measurement; dielectric materials; microwave materials; perturbation techniques; X-band frequency; cavity perturbation method; dielectric constant; dielectric materials; electromagnetic properties; medium loss samples; permittivity measurement; Cavity perturbation methods; Dielectric constant; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Electromagnetic measurements; Frequency; Loss measurement; Permittivity measurement; Dielectric constant; microwave frequencies; perturbation; rectangular cavity;

fLanguage

English

Publisher

ieee

Conference_Titel

Applied Electromagnetics Conference, 2007. AEMC 2007. IEEE

Conference_Location

Kolkata

Print_ISBN

978-1-4244-1863-3

Electronic_ISBN

978-1-4244-1864-0

Type

conf

DOI

10.1109/AEMC.2007.4638036

Filename

4638036