Title :
A simple technique for the measurement of the permittivity of medium loss samples using cavity perturbation method
Author :
Banerjee, Prasun ; Ghosh, Gautam ; Biswas, Salil Kumar
Author_Institution :
Dept. of Phys., Univ. Coll. of Sci., Kolkata
Abstract :
The cavity perturbation method is widely used in the study of electromagnetic properties of dielectric materials at X-band frequencies. It works well for the measurement of low-loss and medium loss materials. In this paper an easy and reliable method is discussed for the accurate determination of the dielectric constant of medium loss samples such as Teflon and Perspex.
Keywords :
dielectric loss measurement; dielectric materials; microwave materials; perturbation techniques; X-band frequency; cavity perturbation method; dielectric constant; dielectric materials; electromagnetic properties; medium loss samples; permittivity measurement; Cavity perturbation methods; Dielectric constant; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Electromagnetic measurements; Frequency; Loss measurement; Permittivity measurement; Dielectric constant; microwave frequencies; perturbation; rectangular cavity;
Conference_Titel :
Applied Electromagnetics Conference, 2007. AEMC 2007. IEEE
Conference_Location :
Kolkata
Print_ISBN :
978-1-4244-1863-3
Electronic_ISBN :
978-1-4244-1864-0
DOI :
10.1109/AEMC.2007.4638036
