DocumentCode :
3012958
Title :
A low noise 32 bit-wide 256 M synchronous DRAM with column-decoded I/O line
Author :
Lee, Seung-Jun ; Park, Kee-Woo ; Chung, Chang-Ho ; Son, Jin-Seung ; Park, Ki-Hong ; Shin, Sang-Ho ; Kim, Seok-Tae ; Han, Jeong-Dong ; Yoo, Hoi-Jun ; Min, Wi-Sik ; Oh, Kye-Hwan
Author_Institution :
Hyundai Electron. Inc., Ichon-Kun, South Korea
fYear :
1995
fDate :
8-10 June 1995
Firstpage :
113
Lastpage :
114
Abstract :
A 32 bit-wide 256 M synchronous DRAM (SDRAM) has been developed. The major design effort has been focused on minimizing the operating current at high clock frequencies to suppress power-line bouncing. The key techniques are split-bank architecture, multiplexed global address-bus with local column address counter, column-decoded data-line, and global data-bus architecture with reduced voltage swing. Simulation shows the reduction in the operating current at 200 MHz is up to 35% compared with a conventional scheme.
Keywords :
CMOS memory circuits; DRAM chips; integrated circuit noise; 200 MHz; 256 Mbit; 32 bit; column-decoded I/O line; global data-bus architecture; high clock frequencies; local column address counter; low noise dynamic RAM; multiplexed global address-bus; operating current reduction; power-line bouncing suppression; split-bank architecture; synchronous DRAM; twin-well CMOS process; Artificial intelligence; Bandwidth; Clocks; Counting circuits; Frequency; Pulse amplifiers; SDRAM; Surges; Voltage; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits, 1995. Digest of Technical Papers., 1995 Symposium on
Conference_Location :
Kyoto, Japan
Print_ISBN :
0-7800-2599-0
Type :
conf
DOI :
10.1109/VLSIC.1995.520711
Filename :
520711
Link To Document :
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