Title :
Using Log likelihood relation for BER analysis of QAM in space diversity
Author :
Alam, Md Zahangir ; Islam, Chowdhury Sajadul ; Alom, Md Zahangir ; Sobhan, M. Abdus
Author_Institution :
Dept. of Electron. & Telecommun. Eng., Prime Univ.
Abstract :
The bit error rate (BER) performance for quadrature amplitude modulation (QAM) with different diversity combining scheme is derived for Rayleigh fading channel using Log-likelihood ratio (LLR). Three combining techniques, maximal ratio combiner (MMC), selection combining (SC), and Equal Gain Combiner (EGC) are considered for the BER analysis in this paper. The average BER performance of QAM symbol through a flat fading channel is derived from the individual bits forming the QAM symbol with MRC, SC, and EGC space diversity. The analytical and simulation of BER performance of the QAM symbol through the fading channel with MMC, SC, and EGC combiner is compared. The both analytical and simulation result shows that the probability of bit error decreases with the order of diversity for all the cases of MRC, SC, and EGC. It is also seen from the results that MRC provides better BER performance than the other two combiners (SC and EGC) for the same environment of the fading channel.
Keywords :
Rayleigh channels; diversity reception; error statistics; probability; quadrature amplitude modulation; space communication links; QAM BER analysis; Rayleigh flat fading channel; bit error rate; equal gain combiner; log likelihood relation; maximal ratio combiner; probability; quadrature amplitude modulation; selection combining; space diversity combining scheme; Analytical models; Bit error rate; Computer science; Diversity reception; Equalizers; Fading; Land mobile radio; Quadrature amplitude modulation; Receiving antennas; Transmitting antennas; Diversity; Diversity Combiner; LLR; QAM; Rayleigh Fading Channel;
Conference_Titel :
Computer and Information Technology, 2008. ICCIT 2008. 11th International Conference on
Conference_Location :
Khulna
Print_ISBN :
978-1-4244-2135-0
Electronic_ISBN :
978-1-4244-2136-7
DOI :
10.1109/ICCITECHN.2008.4803032