DocumentCode :
3013194
Title :
Comparison of broadband impedance spectroscopy and time domain reflectometry for locating cable degradation
Author :
Hirai, Naoshi ; Yamada, Tomoaki ; Ohki, Y.
Author_Institution :
Res. Inst. for Sci. & Eng., Waseda Univ., Tokyo, Japan
fYear :
2012
fDate :
23-27 Sept. 2012
Firstpage :
229
Lastpage :
232
Abstract :
A new method called the broadband impedance spectroscopy (BIS), which is a kind of frequency domain reflectometry, is being developed as a reliable method for locating a degraded portion of a low voltage cable. The sensitivity of the BIS method is compared to that of the time domain reflectometry (TDR). In the first case, the sheath and insulation of a 50-m-long polyvinyl chloride insulated cable were partially peeled off. In the second case, cables insulated with silicone rubber, flame-retardant ethylene propylene rubber, or cross-linked polyethylene, each about 25 m long, were aged simultaneously by heat and γ-irradiation in air. In both two cases, a clear peak indicating the damaged or aged portion appears in the BIS measurement, while no such a peak appears in the TDR measurement. Therefore, the BIS method is much superior to the TDR method for locating a degraded portion in a cable.
Keywords :
power cables; spectroscopy; time-domain reflectometry; γ-irradiation; BIS method; broadband impedance spectroscopy; cable degradation location; cross-linked polyethylene; flame-retardant ethylene propylene rubber; heat irridiation; polyvinyl chloride insulated cable; silicone rubber; time domain reflectometry; Aging; Cable insulation; Cable shielding; Frequency measurement; Impedance; Power generation; Broadband impedance spectroscopy; diagnosis; frequency domain reflectometry; insulation; nuclear power plant; time domain reflectometry;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Condition Monitoring and Diagnosis (CMD), 2012 International Conference on
Conference_Location :
Bali
Print_ISBN :
978-1-4673-1019-2
Type :
conf
DOI :
10.1109/CMD.2012.6416417
Filename :
6416417
Link To Document :
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