DocumentCode
3013701
Title
Automatic design of optimal concurrent fault detector for linear analog systems
Author
Simeu, Emmanuel ; Peters, Arno W. ; Rayane, Iyad
Author_Institution
TIMA-Lab., Grenoble, France
fYear
1999
fDate
15-18 June 1999
Firstpage
184
Lastpage
191
Abstract
This paper presents a generalized strategy for optimal design of on-line integrated fault detector for linear analog systems. The method consists in processing the available node voltage signals to provide a residual signal that carries information about the faults. Contrary to previously proposed techniques dealing only with the particular case of state variable systems, the use of extra circuitry with the objective of concurrent fault detection is extended here without limitation to a larger class of linear analog systems for which the state variables do not necessary need to be available as measurable voltages. This requires the use of an extended state space model for any linear analog system. For this purpose, an algorithm providing the extended state space model from a netlist description is developed and implemented.
Keywords
analogue computers; error detection; fault tolerant computing; concurrent fault detection; extended state space model; fault detector; linear analog systems; netlist description; Circuit faults; Electrical fault detection; Fault detection; Hardware; Mathematical model; Particle measurements; Redundancy; Signal processing; State-space methods; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Fault-Tolerant Computing, 1999. Digest of Papers. Twenty-Ninth Annual International Symposium on
Conference_Location
Madison, WI, USA
ISSN
0731-3071
Print_ISBN
0-7695-0213-X
Type
conf
DOI
10.1109/FTCS.1999.781049
Filename
781049
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