DocumentCode :
3013701
Title :
Automatic design of optimal concurrent fault detector for linear analog systems
Author :
Simeu, Emmanuel ; Peters, Arno W. ; Rayane, Iyad
Author_Institution :
TIMA-Lab., Grenoble, France
fYear :
1999
fDate :
15-18 June 1999
Firstpage :
184
Lastpage :
191
Abstract :
This paper presents a generalized strategy for optimal design of on-line integrated fault detector for linear analog systems. The method consists in processing the available node voltage signals to provide a residual signal that carries information about the faults. Contrary to previously proposed techniques dealing only with the particular case of state variable systems, the use of extra circuitry with the objective of concurrent fault detection is extended here without limitation to a larger class of linear analog systems for which the state variables do not necessary need to be available as measurable voltages. This requires the use of an extended state space model for any linear analog system. For this purpose, an algorithm providing the extended state space model from a netlist description is developed and implemented.
Keywords :
analogue computers; error detection; fault tolerant computing; concurrent fault detection; extended state space model; fault detector; linear analog systems; netlist description; Circuit faults; Electrical fault detection; Fault detection; Hardware; Mathematical model; Particle measurements; Redundancy; Signal processing; State-space methods; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Fault-Tolerant Computing, 1999. Digest of Papers. Twenty-Ninth Annual International Symposium on
Conference_Location :
Madison, WI, USA
ISSN :
0731-3071
Print_ISBN :
0-7695-0213-X
Type :
conf
DOI :
10.1109/FTCS.1999.781049
Filename :
781049
Link To Document :
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