• DocumentCode
    3013754
  • Title

    An accurate quasi-saturation BJT model for very-high-frequency analog/digital applications

  • Author

    Fuse, T. ; Shuto, Y. ; Oowaki, Y.

  • Author_Institution
    ULSI Res. Center, Toshiba Corp., Kawasaki, Japan
  • fYear
    1995
  • fDate
    8-10 June 1995
  • Firstpage
    121
  • Lastpage
    122
  • Abstract
    An accurate quasi-saturation BJT model is proposed for very-high-frequency analog and digital applications. In modern low-power analog and digital circuits, the BJT often operates in a low collector voltage and high collector current region. Under such a quasi-saturation condition, base and collector resistances have nonlinear characteristics and the base pushout phenomenon occurs. However, these phenomena are not taken into the conventional small-signal model accurately, so that the collector current, the small-signal input impedance, and the small-signal current gain are overestimated under the quasi-saturation condition. We have developed linearized base and collector resistance models and the physically based base pushout model for accurate circuit simulations.
  • Keywords
    bipolar analogue integrated circuits; bipolar digital integrated circuits; bipolar transistors; circuit analysis computing; equivalent circuits; integrated circuit design; semiconductor device models; base pushout phenomenon; base resistances; circuit simulations; collector resistances; high collector current; low collector voltage; nonlinear characteristics; quasi-saturation BJT model; quasi-saturation condition; small-signal current gain; small-signal input impedance; very-high-frequency analog/digital applications; Circuit simulation; Conductivity; Contact resistance; Equivalent circuits; Frequency; Impedance; Laboratories; Thermal resistance; Ultra large scale integration; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits, 1995. Digest of Technical Papers., 1995 Symposium on
  • Conference_Location
    Kyoto, Japan
  • Print_ISBN
    0-7800-2599-0
  • Type

    conf

  • DOI
    10.1109/VLSIC.1995.520715
  • Filename
    520715