DocumentCode :
3013770
Title :
3D shape reconstruction system for dielectric material specimens surface measurement
Author :
Jianli Shang ; Changwan Lee ; Seung Hwang-bo ; June-Ho Lee ; Jongkwon Kim
Author_Institution :
Honam Univ., Gwangju, South Korea
fYear :
2012
fDate :
23-27 Sept. 2012
Firstpage :
332
Lastpage :
335
Abstract :
In this study, a 3D shape reconstruction system was assembled, by which the roughness of a piece of dielectric material specimen, also electrode configuration, can be measured without physical connection. The system, which consists of a CCD camera, a DLP projector and a desktop computer, was calibrated properly. The 3D shape reconstruction algorithm based on the phase shifting technology was put into practice by means of LabVIEW programming. The 3D data processing procedure includes phase wrapping, phase unwrapping and phase to depth calculation. In this research, both the 3-frame and the 4-frame phase shifting method were utilized to obtain a wrapped phase pattern, which was then unwrapped by the Goldstein algorithm and the quality map guided algorithm respectively to generate a continuous phase map. The result shows that the Goldstein algorithm is less time consuming while the quality map guided algorithm handles the residues better. The depth of the measured object was calculated from the phase difference of two corresponding pixels from the phase map of a reference plate and the phase map of the object.
Keywords :
dielectric materials; dielectric measurement; electrodes; materials science computing; virtual instrumentation; 3-frame phase shifting method; 3D data processing procedure; 3D shape reconstruction system; 4-frame phase shifting method; DLP projector; Goldstein algorithm; LabVIEW programming; continuous phase map; desktop computer; dielectric material specimen surface measurement; electrode configuration; phase shifting technology; phase unwrapping; phase wrapping; quality map guided algorithm; reference plate; wrapped phase pattern; Cameras; Dielectric materials; Dielectric measurements; Image reconstruction; Shape; Surface reconstruction; Wrapping; 3-D shape reconstruction; dielectrics materials; phase unwrapping; phase-shifting method;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Condition Monitoring and Diagnosis (CMD), 2012 International Conference on
Conference_Location :
Bali
Print_ISBN :
978-1-4673-1019-2
Type :
conf
DOI :
10.1109/CMD.2012.6416445
Filename :
6416445
Link To Document :
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