Title :
Quantitative Phase Microscopy by Multi-wavelength Phase-Shifting Interference Microscopy
Author :
Warnasooriya, N. ; Kim, M.K.
Author_Institution :
Univ. of South Florida Tampa, Tampa
Abstract :
The phase-shifting interference microscopy is combined with the multi-wavelength optical phase unwrapping to obtain quantitative phase profiles of microscopic objects without 2 pi discontinuities. Due to broadband light sources, images are less affected by coherent noise.
Keywords :
holographic interferometry; phase shifting interferometry; coherent noise; multiwavelength optical phase unwrapping; multiwavelength phase-shifting interference microscopy; quantitative phase microscopy; Holographic optical components; Holography; Interference; Light sources; Noise level; Optical interferometry; Optical microscopy; Optical noise; Phase noise; Physics;
Conference_Titel :
Lasers and Electro-Optics, 2007. CLEO 2007. Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-55752-834-6
DOI :
10.1109/CLEO.2007.4453095
