Title :
Monitoring infrared light using a commercial variable optical attenuator subjected to defect engineering
Author :
Knights, A.P. ; Jessop, P.E. ; Bruce, D.M. ; Logan, D.F. ; Luff, B.J. ; Zheng, D. ; Shafiiha, R. ; Asghari, M.
Author_Institution :
Dept. of Eng. Phys., McMaster Univ., Hamilton, ON
Abstract :
The fabrication of silicon-waveguide power monitors via the introduction of defects to commercially produced variable optical attenuators is demonstrated. Devices show an effective quantum efficiency of ~1% for a tapped fraction of signal of 30%.
Keywords :
elemental semiconductors; optical attenuators; optical fabrication; optical sensors; optical waveguides; silicon; Si; defect engineering; optical detectors; quantum efficiency; silicon-waveguide power monitors; tapped fraction; Infrared surveillance; Integrated optics; Monitoring; Optical attenuators; Optical detectors; Optical device fabrication; Optical waveguides; Photoconductivity; Power engineering and energy; Silicon;
Conference_Titel :
Group IV Photonics, 2008 5th IEEE International Conference on
Conference_Location :
Cardiff
Print_ISBN :
978-1-4244-1769-8
Electronic_ISBN :
978-1-4244-1768-1
DOI :
10.1109/GROUP4.2008.4638105
