DocumentCode :
3013998
Title :
Performance and reliability evaluation of passive replication schemes in application level fault tolerance
Author :
Garg, Sachin ; Huang, Yennun ; Kintala, Chandra M R ; Trivedi, Kishor S. ; Yajnik, Shalini
Author_Institution :
Lucent Tech., AT&T Bell Labs., NJ, USA
fYear :
1999
fDate :
15-18 June 1999
Firstpage :
322
Lastpage :
329
Abstract :
Process replication is provided as the central mechanism for application level software fault tolerance in SwiFT and DOORS. These technologies, implemented as reusable software modules, support cold and warm schemes of passive replication. The choice of a scheme for a particular application is based on its availability and performance requirements. In this paper we analyze the performability of a server software which may potentially use these technologies. We derive closed form formulae for availability throughput and probability of loss of a job. Six scenarios of loss are modeled and for each, these expressions are derived. The formulae can be used either of time or online to determine the optimal replication scheme.
Keywords :
replicated databases; software fault tolerance; software reusability; DOORS; SwiFT; application level fault tolerance; closed form formulae; optimal replication scheme; passive replication schemes; performance evaluation; performance requirements; reliability evaluation; reusable software modules; server software; software fault tolerance; Application software; Availability; Fault detection; Fault tolerance; Local area networks; Software design; Software libraries; Software tools; Switches; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Fault-Tolerant Computing, 1999. Digest of Papers. Twenty-Ninth Annual International Symposium on
Conference_Location :
Madison, WI, USA
ISSN :
0731-3071
Print_ISBN :
0-7695-0213-X
Type :
conf
DOI :
10.1109/FTCS.1999.781067
Filename :
781067
Link To Document :
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