DocumentCode :
3014072
Title :
Programmable memory BIST and a new synthesis framework
Author :
Zarrineh, Kamran ; Upadhyaya, Shambhu J.
Author_Institution :
IBM Corp., Endicott, NY, USA
fYear :
1999
fDate :
15-18 June 1999
Firstpage :
352
Lastpage :
355
Abstract :
The development of two programmable memory BIST architectures is first reported. A memory synthesis framework which can automatically generate, verify and insert programmable as well as non-programmable BIST units is developed as a vehicle to efficiently integrate BIST architectures in today´s memory-intensive systems. Custom memory test algorithms could be loaded in the developed programmable BIST unit and therefore any type of memory test algorithm could be realized. The flexibility and efficiency of the framework are demonstrated by showing that these memory BIST units could be generated, functionally verified and inserted in a short time.
Keywords :
built-in self test; high level synthesis; integrated memory circuits; memory architecture; BIST architectures; memory synthesis; memory-intensive systems; programmable memory BIST architectures; Automatic testing; Built-in self-test; Computer architecture; Fabrication; Hardware; Logic design; Logic testing; Memory architecture; Test pattern generators; Time to market;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Fault-Tolerant Computing, 1999. Digest of Papers. Twenty-Ninth Annual International Symposium on
Conference_Location :
Madison, WI, USA
ISSN :
0731-3071
Print_ISBN :
0-7695-0213-X
Type :
conf
DOI :
10.1109/FTCS.1999.781072
Filename :
781072
Link To Document :
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