• DocumentCode
    3014072
  • Title

    Programmable memory BIST and a new synthesis framework

  • Author

    Zarrineh, Kamran ; Upadhyaya, Shambhu J.

  • Author_Institution
    IBM Corp., Endicott, NY, USA
  • fYear
    1999
  • fDate
    15-18 June 1999
  • Firstpage
    352
  • Lastpage
    355
  • Abstract
    The development of two programmable memory BIST architectures is first reported. A memory synthesis framework which can automatically generate, verify and insert programmable as well as non-programmable BIST units is developed as a vehicle to efficiently integrate BIST architectures in today´s memory-intensive systems. Custom memory test algorithms could be loaded in the developed programmable BIST unit and therefore any type of memory test algorithm could be realized. The flexibility and efficiency of the framework are demonstrated by showing that these memory BIST units could be generated, functionally verified and inserted in a short time.
  • Keywords
    built-in self test; high level synthesis; integrated memory circuits; memory architecture; BIST architectures; memory synthesis; memory-intensive systems; programmable memory BIST architectures; Automatic testing; Built-in self-test; Computer architecture; Fabrication; Hardware; Logic design; Logic testing; Memory architecture; Test pattern generators; Time to market;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fault-Tolerant Computing, 1999. Digest of Papers. Twenty-Ninth Annual International Symposium on
  • Conference_Location
    Madison, WI, USA
  • ISSN
    0731-3071
  • Print_ISBN
    0-7695-0213-X
  • Type

    conf

  • DOI
    10.1109/FTCS.1999.781072
  • Filename
    781072