DocumentCode
3014072
Title
Programmable memory BIST and a new synthesis framework
Author
Zarrineh, Kamran ; Upadhyaya, Shambhu J.
Author_Institution
IBM Corp., Endicott, NY, USA
fYear
1999
fDate
15-18 June 1999
Firstpage
352
Lastpage
355
Abstract
The development of two programmable memory BIST architectures is first reported. A memory synthesis framework which can automatically generate, verify and insert programmable as well as non-programmable BIST units is developed as a vehicle to efficiently integrate BIST architectures in today´s memory-intensive systems. Custom memory test algorithms could be loaded in the developed programmable BIST unit and therefore any type of memory test algorithm could be realized. The flexibility and efficiency of the framework are demonstrated by showing that these memory BIST units could be generated, functionally verified and inserted in a short time.
Keywords
built-in self test; high level synthesis; integrated memory circuits; memory architecture; BIST architectures; memory synthesis; memory-intensive systems; programmable memory BIST architectures; Automatic testing; Built-in self-test; Computer architecture; Fabrication; Hardware; Logic design; Logic testing; Memory architecture; Test pattern generators; Time to market;
fLanguage
English
Publisher
ieee
Conference_Titel
Fault-Tolerant Computing, 1999. Digest of Papers. Twenty-Ninth Annual International Symposium on
Conference_Location
Madison, WI, USA
ISSN
0731-3071
Print_ISBN
0-7695-0213-X
Type
conf
DOI
10.1109/FTCS.1999.781072
Filename
781072
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