Title :
Free carrier lifetime modification for silicon waveguide based devices
Author :
Wright, N.M. ; Thomson, D.J. ; Litvinenko, K.L. ; Headley, W.R. ; Smith, A.J. ; Knights, A.P. ; Gardes, F.Y. ; Mashanovich, G.Z. ; Gwilliam, R. ; Reed, G.T.
Author_Institution :
Adv. Technol. Inst., Univ. of Surrey, Guildford
Abstract :
We investigate the effects of implanting silicon directly into a silicon waveguide to modify carrier lifetime. Experimental results show over 85% reduction in the carrier lifetime for only a small net increase in optical absorption.
Keywords :
carrier lifetime; elemental semiconductors; integrated optics; ion implantation; optical losses; optical waveguides; silicon; Si; free carrier lifetime modification; ion implantation; optical loss; silicon waveguide based devices; Absorption; Charge carrier lifetime; Implants; Ion implantation; Optical losses; Optical surface waves; Optical waveguides; Particle beam optics; Silicon; Wavelength measurement;
Conference_Titel :
Group IV Photonics, 2008 5th IEEE International Conference on
Conference_Location :
Cardiff
Print_ISBN :
978-1-4244-1769-8
Electronic_ISBN :
978-1-4244-1768-1
DOI :
10.1109/GROUP4.2008.4638118
