Title :
X-ray spectroscopy studies of luminescent Si-based materials
Author :
Roschuk, T. ; Wilson, P. R J ; Li, J. ; Wojcik, J. ; Mascher, P.
Author_Institution :
Dept. of Eng. Phys., McMaster Univ., Hamilton, ON
Abstract :
X-ray based spectroscopies have been used to study nanocluster formation and luminescence in silicon oxynitride-based materials. For a luminescent Ce-doped silicon oxide details of the local chemical environment of the Ce atoms has been obtained.
Keywords :
X-ray spectra; luminescence; nanostructured materials; nanotechnology; silicon compounds; SiON; X-ray spectra; luminescence; nanocluster formation; silicon oxynitride-based materials; Annealing; Chemicals; Dielectrics; Electromagnetic wave absorption; Luminescence; Optical films; Pollution measurement; Sea measurements; Silicon; Spectroscopy;
Conference_Titel :
Group IV Photonics, 2008 5th IEEE International Conference on
Conference_Location :
Cardiff
Print_ISBN :
978-1-4244-1769-8
Electronic_ISBN :
978-1-4244-1768-1
DOI :
10.1109/GROUP4.2008.4638175
