Linear ion trap for second order Doppler shift reduction in frequency standard applications

Author

Prestage, J.D. ; Janik, G.R. ; Dick, G.J. ; Tucker, T.K. ; Maleki, L.

Author_Institution

Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA

fYear

1989

fDate

31 May-2 Jun 1989

Firstpage

135

Lastpage

142

Abstract

A novel linear ion trap is designed and being tested which permits storage of a large number of ions with reduced susceptibility to the second-order Doppler effect caused by the RF confining fields. This trap should store about 20 times the number of ions storable by a conventional RF trap, with no corresponding increase in second-order Doppler shift from the confining field. In addition the sensitivity of this shift to trapping parameters, i.e. RF voltage, RF frequency, and trap size, is greatly reduced. Mercury ions and xenon ions are trapped in the presence of helium buffer gas. Trap times as long as 2×10 ³ s have been measured

Keywords

Doppler effect; atomic clocks; frequency measurement; ion optics; measurement standards; time measurement; 2×10³ s; He buffer gas; Hg ions; RF confining fields; Xe ions; frequency standard applications; linear ion trap; second order Doppler shift reduction; Clocks; Doppler effect; Doppler shift; Laboratories; Propulsion; Radio frequency; Stability; Standards development; Testing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control, 1989., Proceedings of the 43rd Annual Symposium on

Conference_Location

Denver, CO

Type

conf

DOI

10.1109/FREQ.1989.68848

Filename

68848