DocumentCode :
3015662
Title :
Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001
fYear :
2001
fDate :
13-16 March 2001
Abstract :
The following topics were dealt with. IP-based design; design languages; BIST; SoC testing; low-power systems; test generation; VLIW; on-line testing; packaging; mixed-signal circuits; power optimisation; interconnects; routing; layout generation; reconfigurable computing; embedded systems; and system verification
Keywords :
application specific integrated circuits; built-in self test; circuit optimisation; embedded systems; formal verification; high level languages; industrial property; integrated circuit interconnections; integrated circuit testing; low-power electronics; mixed analogue-digital integrated circuits; network routing; packaging; parallel architectures; reconfigurable architectures; BIST; IP-based design; SoC testing; VLIW; design language; embedded systems; interconnects; layout generation; low-power systems; mixed-signal circuits; on-line testing; packaging; power optimisation; reconfigurable computing; routing; system verification; test generation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings
Conference_Location :
Munich, Germany
ISSN :
1530-1591
Print_ISBN :
0-7695-0993-2
Type :
conf
DOI :
10.1109/DATE.2001.914991
Filename :
914991
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3015662
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