DocumentCode :
3015674
Title :
New and extended possibilities of orientation dependent etching in microtechnics
Author :
Hannemann, Birgit ; Frühauf, Joachim
Author_Institution :
Dept. of Electr. Eng. & Inf. Technol., Tech. Univ. Chemnitz, Germany
fYear :
1998
fDate :
25-29 Jan 1998
Firstpage :
234
Lastpage :
239
Abstract :
We will demonstrate that the simple and inexpensive process of orientation dependent wet chemical etching can also be used for the preparation of more complex shapes and elements in microtechnics. In this way it is possible to apply unusual or any mask directions, multi-step etch processes by changing the mask or the etchant between the single steps, modified etchants (like etchants with inorganic or organic additives). The etch rates, the inclinations and the surface qualities of slow etching sidewall faces growing along mask edges in different directions and with different etchants are estimated. With the knowledge of the rates the etching process can be simulated for given mask dimensions and etch conditions
Keywords :
digital simulation; elemental semiconductors; etching; masks; micromechanical devices; physics computing; silicon; MEMS; Si; etch rates; inclinations; microtechnics; orientation dependent etching; sidewall faces; wet chemical etching; Additives; Anisotropic magnetoresistance; Chemical elements; Chemical engineering; Chemical processes; Chemical technology; Crystallography; Information technology; Shape; Wet etching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 1998. MEMS 98. Proceedings., The Eleventh Annual International Workshop on
Conference_Location :
Heidelberg
ISSN :
1084-6999
Print_ISBN :
0-7803-4412-X
Type :
conf
DOI :
10.1109/MEMSYS.1998.659760
Filename :
659760
Link To Document :
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