• DocumentCode
    3015756
  • Title

    Using curve-fitting optimisation technique to estimate power MOSFET model parameters for PECT II system

  • Author

    Aris, I.B. ; Hulley, L.N. ; Mariun, N.B. ; Sahbudin, R.K.Z.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Putra Malaysia Univ., Serdang, Malaysia
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    157
  • Lastpage
    161
  • Abstract
    This paper presents a proposed new structure of the power MOSFET model and its implementation in the HSPICE and PECT II (Power Electronics and Control Tool) packages. A fast and accurate technique for determining power MOSFET model parameters which introduces a curve-fitting optimisation technique is discussed in detail. The optimisation process generates automatically a set of device parameters based on the input specification, measured data and manufacturer´s data sheets. The input procedure involves a netlist specifying parameter tolerances, component voltage and current limits and an initial guess to the selected parameter. Using curve fitting and iterative methods, the “correct” model is generated for utilisation in the simulation phase of both the HSPICE and PECT II packages. This method is then compared to that of a normal method which uses specific formulae to obtain power MOSFET model parameters. The results show that the curve-fitting optimisation technique produces more accurate power MOSFET model parameters than the other method. Both simulation and experimental results of the power MOSFET characteristics are also included in the discussion
  • Keywords
    SPICE; curve fitting; iterative methods; optimisation; parameter estimation; power MOSFET; semiconductor device models; semiconductor device testing; software tools; HSPICE; MOSFET characteristics; PECT II package; PECT II system; Power Electronics and Control Tool package; component current limits; component voltage limits; curve fitting; curve-fitting optimisation technique; data sheets; device parameters; input specification; iterative methods; measured data; netlist; optimisation proces; parameter tolerances; power MOSFET model; power MOSFET model parameters; power MOSFET model parameters estimation; Automatic control; Curve fitting; Electronics packaging; Iterative methods; MOSFET circuits; Manufacturing automation; Manufacturing processes; Power MOSFET; Power electronics; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics, 1998. Proceedings. ICSE '98. 1998 IEEE International Conference on
  • Conference_Location
    Bangi
  • Print_ISBN
    0-7803-4971-7
  • Type

    conf

  • DOI
    10.1109/SMELEC.1998.781171
  • Filename
    781171