Title :
Current sensor and test processor design for integration of logic and IDDQ testing of CMOS ICs
Author :
Altaf-Ul-Amin, Md ; Darus, Zahari Mohamed
Author_Institution :
Dept. of Electr. Electron. & Syst. Eng., Kebangsaan Malaysia Univ., Malaysia
Abstract :
This paper presents an approach to integrate logic and IDDQ testing which are crucial in verifying the functionality and improving the reliability of CMOS ICs. Work presented in this paper involves the design of an off-chip current sensor and a compatible test processor for the aforementioned purpose. The sensor is an analog circuit and the test processor is a digital ASIC. The performance of both the sensor and the test processor has been verified through computer simulation. Fault simulation results show that reasonable numbers of test vectors generated by the scheme used in this work are able to detect all detectable stuck-at faults in some ISCAS´85 benchmark circuits
Keywords :
CMOS integrated circuits; analogue integrated circuits; application specific integrated circuits; circuit simulation; electric current measurement; electric sensing devices; fault simulation; integrated circuit design; integrated circuit reliability; integrated circuit testing; logic testing; CMOS ICs; IDDQ testing; benchmark circuits; computer simulation; current sensor design; detectable stuck-at faults; digital ASIC test processor; fault simulation; functionality; logic testing; logic/IDDQ testing integration; off-chip current sensor; reliability; sensor analog circuit; test processor; test processor design; test vectors; Analog circuits; CMOS logic circuits; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Integrated circuit reliability; Logic design; Logic testing; Process design;
Conference_Titel :
Semiconductor Electronics, 1998. Proceedings. ICSE '98. 1998 IEEE International Conference on
Conference_Location :
Bangi
Print_ISBN :
0-7803-4971-7
DOI :
10.1109/SMELEC.1998.781172
