Title :
Diagnosis for scan-based BIST: reaching deep into the signatures
Author :
Bayraktaroglu, Ismet ; Orailoglu, Alex
Author_Institution :
Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
Abstract :
For partitioning-based diagnosis in a scan-based BIST environment, an exact analysis scheme, capable of identifying all scan cells that receive incorrect data, is proposed. In contrast to previously suggested approaches, the scheme we propose identifies all failing scan cells with no ambiguity whatsoever. Not only do we resolve failing scan cells unambiguously, but we do so at the earliest possible instance through reexamination of already computed signatures. Intensive utilization of this highly precise diagnostic state information leads to prognostic information regarding the usefulness of running upcoming tests which in turn leads to reductions in diagnosis time in excess of 30% compared to previous approaches
Keywords :
boundary scan testing; built-in self test; fault diagnosis; logic partitioning; logic testing; already computed signatures; diagnosis time; diagnostic state information; failing scan cells; partitioning-based diagnosis; prognostic information; scan-based BIST; upcoming tests; Application software; Built-in self-test; Computer science; Costs; Data engineering; Fasteners; Fault diagnosis; Fault location; Hardware; Testing;
Conference_Titel :
Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings
Conference_Location :
Munich
Print_ISBN :
0-7695-0993-2
DOI :
10.1109/DATE.2001.915008