Title :
On applying the set covering model to reseeding
Author :
Chiusano, Silvia ; Di Carlo, Stefano ; Prinetto, Paolo ; Wunderlich, Hans-Joachim
Author_Institution :
Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
Abstract :
The Functional BIST approach is a rather new BIST technique based on exploiting embedded system functionality to generate deterministic test patterns during BIST. The approach takes advantages of two well-known testing techniques, the arithmetic BIST approach and the reseeding method. The main contribution of the present paper consists in formulating the problem of an optimal reseeding computation as an instance of the set covering problem. The proposed approach guarantees high flexibility, is applicable to different functional modules, and, in general, provides a more efficient test set encoding then previous techniques. In addition, the approach shorts the computation time and allows to better exploiting the tradeoff between area overhead and global test length as well as to deal with larger circuits
Keywords :
built-in self test; computational complexity; encoding; integrated circuit testing; arithmetic BIST; computation time; deterministic test patterns; embedded system functionality; flexibility; functional BIST; functional modules; global test length; optimal reseeding computation; overhead; reseeding; set covering model; Arithmetic; Built-in self-test; Circuit analysis computing; Circuit faults; Circuit testing; Encoding; Minimization; Sequential analysis; System testing; World Wide Web;
Conference_Titel :
Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings
Conference_Location :
Munich
Print_ISBN :
0-7695-0993-2
DOI :
10.1109/DATE.2001.915017