• DocumentCode
    3016328
  • Title

    Optimization of debye parameters for dielectric materials and investigation of symmetric SPP mode propagation properties in DMD waveguide

  • Author

    Saber, Md Ghulam ; Sagor, Rakibul Hasan ; Al Noor, Asif ; Al-Amin, Md Thesun

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Islamic Univ. of Technol., Gazipur, Bangladesh
  • fYear
    2013
  • fDate
    5-8 Aug. 2013
  • Firstpage
    262
  • Lastpage
    265
  • Abstract
    The Modified Debye Model (MDM) parameters for Cuprous Oxide (Cu2O) and Silicon-Germanium Alloy (1.5:1) are presented. A nonlinear optimization algorithm has been developed in order to optimize the parameters for the materials. The obtained parameters have been used to determine the complex relative permittivity, which show an excellent agreement with the experimental values. The root-mean-square (RMS) deviations are found to be as little as 0.1638 and 0.3710 respectively. Finally symmetric Surface Plasmon Polariton (SPP) mode propagation properties in a Dielectric-Metal-Dielectric (DMD) waveguide constructed with silver (Ag) and Cu2O have been studied both analytically and numerically for further verification of the obtained MDM parameters.
  • Keywords
    Ge-Si alloys; copper compounds; dielectric waveguides; finite difference time-domain analysis; optimisation; permittivity; polaritons; silver; surface plasmons; Cu2O-Ag-Cu2O; SixGe1-x; complex relative permittivity; dielectric materials; dielectric-metal-dielectric waveguide; modified Debye model parameters; nonlinear optimization algorithm; numerical analysis; root-mean-square deviations; symmetric surface plasmon polariton mode propagation; Dielectric materials; Electric fields; Mathematical model; Metals; Numerical models; Permittivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2013 13th IEEE Conference on
  • Conference_Location
    Beijing
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4799-0675-8
  • Type

    conf

  • DOI
    10.1109/NANO.2013.6720896
  • Filename
    6720896