DocumentCode
3016332
Title
A BIST Technique for Configurable Nanofabric Arrays
Author
Al-Assadi, Waleed K. ; Joshi, Mandar V. ; Chaudhry, Ghulam M.
Author_Institution
Dept. of Electr. & Comput. Eng., Missouri Univ. of Sci. & Technol., Rolla, MO
fYear
2008
fDate
29-30 Sept. 2008
Firstpage
63
Lastpage
66
Abstract
This work proposes a built-in self test (BIST) approach to test crossbars for a defined set of faults. The BIST can classify the different programmable elements in the crossbars as non-defective or defective with a certain fault type. The logic synthesis can then configure the crossbar by avoiding these defective elements.
Keywords
built-in self test; logic testing; nanoelectronics; programmable circuits; BIST technique; built-in self test; configurable nanofabric arrays; crossbars; logic synthesis; programmable elements; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Cities and towns; Fault detection; Logic devices; Logic testing; Nanoscale devices; System testing; BIST; Crossbar; Test; configuration; nano;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Test of Nano Devices, Circuits and Systems, 2008 IEEE International Workshop on
Conference_Location
Cambridge, MA
Print_ISBN
978-0-7695-3379-7
Type
conf
DOI
10.1109/NDCS.2008.8
Filename
4638336
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