DocumentCode :
3016349
Title :
The Case for Reconfigurable Components with Logic Scrubbing: Regular Hygiene Keeps Logic FIT (Low)
Author :
DeHon, André
Author_Institution :
Dept. of Electr. & Syst. Eng., Univ. of Pennsylvania, Philadelphia, PA
fYear :
2008
fDate :
29-30 Sept. 2008
Firstpage :
67
Lastpage :
70
Abstract :
As we approach atomic-scale logic, we must accommodate an increased rate of manufacturing defects, transient upsets, and in-field persistent failures. High defect rates demand reconfiguration to avoid defective components, and transient upsets demand online error detection to catch failures. Combining these techniques we can detect in-field persistent failures when they occur and reconfigure around them. However, since failures may be logically masked for long periods of time, persistent failures may accumulate silently; this integration of errors over time means the effective failure rate for persistent errors can exceed transient upset rates. As a result, logic scrubbing is necessary to prevent the silent accumulation of an undetectable number of persistent errors. We provide simple analysis to illustrate quantitatively how this phenomena can be a concern.
Keywords :
circuit reliability; error detection; logic gates; atomic-scale logic; defect rates; in-field persistent failures; logic masking; logic scrubbing; node upsets; online error detection; reconfigurable components; reliability; Circuit testing; Circuits and systems; Conferences; Logic circuits; Logic design; Logic devices; Logic testing; Manufacturing; Reconfigurable logic; System testing; Fault Tolerance; Logic Scrubbing; Reconfiguration; Reliability; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Test of Nano Devices, Circuits and Systems, 2008 IEEE International Workshop on
Conference_Location :
Cambridge, MA
Print_ISBN :
978-0-7695-3379-7
Type :
conf
DOI :
10.1109/NDCS.2008.17
Filename :
4638337
Link To Document :
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