• DocumentCode
    3016408
  • Title

    Accelerated Functional Testing of Digital Microfluidic Biochips

  • Author

    Mitra, Debasis ; Ghoshal, Sarmishtha ; Rahaman, Hafizur ; Bhattacharya, Bhargab B. ; Majumder, D.D. ; Chakrabarty, Krishnendu

  • Author_Institution
    West Bengal Univ. of Technol., Kolkata
  • fYear
    2008
  • fDate
    29-30 Sept. 2008
  • Firstpage
    81
  • Lastpage
    84
  • Abstract
    Structural testing of digital microfluidic biochips targets the detection of physical defects, but it does not guarantee robust execution of target bioassays or the integrity of assay outcomes. Functional testing is needed to detect fluidic malfunctions. Such tests ensure, whether or not, the elementary fluidic operations, such as droplet transportation, mixing, incubation, and splitting are reliably executed on the microfluidic array. Routing test and mixing/splitting test are two most important functional test procedures. We present two procedures for optimal bidirectional routing test and accelerated mixing/splitting test. Compared to previous methods, these procedures need significantly fewer droplet manipulation steps and reduced execution time. The proposed method of functional testing in an N x N microfluidic array requires only a constant number of mixing/splitting steps. Further, the test outcome is free from boundary errors related to droplet size that may arise during mixing/splitting test.
  • Keywords
    bioMEMS; digital integrated circuits; drops; integrated circuit testing; lab-on-a-chip; life testing; microfluidics; mixing; accelerated functional testing; accelerated mixing-splitting test; boundary errors; digital microfluidic biochip array; droplet manipulation steps; droplet size; elementary fluidic operation; optimal bidirectional routing test; Circuit testing; DNA; Design engineering; Diseases; Life estimation; Microfluidics; Robustness; Routing; System testing; Transportation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Test of Nano Devices, Circuits and Systems, 2008 IEEE International Workshop on
  • Conference_Location
    Cambridge, MA
  • Print_ISBN
    978-0-7695-3379-7
  • Type

    conf

  • DOI
    10.1109/NDCS.2008.15
  • Filename
    4638340