DocumentCode
3016418
Title
Author index
fYear
2008
fDate
29-30 Sept. 2008
Firstpage
85
Lastpage
85
Abstract
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Test of Nano Devices, Circuits and Systems, 2008 IEEE International Workshop on
Conference_Location
Cambridge, MA
Print_ISBN
978-0-7695-3379-7
Type
conf
DOI
10.1109/NDCS.2008.25
Filename
4638341
Link To Document