Title :
A low cost method for testing offset and gain error for ADC BIST
Author :
Duan, Jingbo ; Chen, Degang ; Geiger, Randall
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
Abstract :
As the Systems-on-Chips (SoCs) complexity increases, test cost contributes more in the total cost. Especially, test of deeply embedded analog and mixed signal blocks are the most costly test. Built-In Self-Test (BIST) is considered as a low cost substitution of traditional production test. This paper presents a low cost method for testing ADC´s offset and gain error. This is a complement of previous published linearity and spectral performance test methods. The simulation results show the method has good accuracy.
Keywords :
analogue-digital conversion; built-in self test; circuit testing; ADC BIST; SoC; analog signal block; built-in self-test; gain error; low cost method; mixed signal block; offset testing; performance test method; production testing; systems-on-chip; Accuracy; Built-in self-test; Equations; Estimation error; Linearity; Mathematical model;
Conference_Titel :
Circuits and Systems (ISCAS), 2012 IEEE International Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-4673-0218-0
DOI :
10.1109/ISCAS.2012.6271677
