Title :
Opto-Mechanical Modal Spectroscopy: Opto-Excited Vibrations of a Micron-Scale On-Chip Resonator
Author :
Carmon, Tal ; Vahala, Kerry J.
Author_Institution :
Caltech, Pasadena
Abstract :
Radiation pressure is used to excite vibrational modes of an optical micro-cavity at GHz rates. Many spectral lines associated with high-order vibrational modes are measured. Perturbation of the cavity geometry is observed to induce splitting of the spectral lines. copy 2007 Optical Society of America OCIS codes: (230.1040) Acousto-optical devices: (300.6330) Spectroscopy, inelastic scattering including Raman.
Keywords :
micro-optics; microcavities; micromechanical resonators; optical resonators; radiation pressure; spectroscopy; vibrations; cavity geometry perturbation; high-order vibrational modes; micron-scale on-chip resonator; optical micro-cavity; opto-excited vibrations; opto-mechanical modal spectroscopy; radiation pressure; spectral lines splitting; Frequency; Mechanical variables measurement; Optical bistability; Optical feedback; Optical noise; Optical resonators; Optical scattering; Quantum mechanics; Spectroscopy; Vibrations;
Conference_Titel :
Lasers and Electro-Optics, 2007. CLEO 2007. Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-55752-834-6
DOI :
10.1109/CLEO.2007.4453243
