DocumentCode
3016685
Title
Settling time and noise optimization of a three-stage operational transconductance amplifier
Author
Seth, Siddharth ; Murmann, Boris
Author_Institution
Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
fYear
2012
fDate
20-23 May 2012
Firstpage
205
Lastpage
208
Abstract
This paper presents the design and optimization of a nested-Miller compensated, three-stage operational transconductance amplifier (OTA) in 90-nm CMOS that is used in a switched-capacitor (SC) gain stage clocked at 200 MHz. Existing design methods for three-stage OTAs lead to sub-optimal solutions because they decouple inter-related metrics like noise and settling performance. In our approach, the problem of finding an optimal design with the best total integrated noise and settling time has been cohesively solved by formulating a nonlinear constrained optimization program. Equality, inequality, and semi-infinite constraints are formed using closed form symbolic expressions obtained by a closed loop analysis of the SC gain stage and the optimization program is solved by using the interior-point algorithm. Simulation results show that the amplifier achieves a ± 0.1% dynamic error settling time of 2.5 ns with a total integrated noise of 240 μVrms, while consuming 5.2 mW from a 1-V power supply.
Keywords
CMOS analogue integrated circuits; integrated circuit design; nonlinear programming; operational amplifiers; OTA; SC gain stage; closed-form symbolic expression; closed-loop analysis; equality constraint; frequency 200 MHz; inequality constraint; integrated noise; interior-point algorithm; nested-Miller compensation; noise optimization; nonlinear constrained optimization program; optimal design; power 5.2 mW; semiinfinite constraint; settling time; size 90 nm; switched-capacitor gain stage; three-stage OTA; three-stage operational transconductance amplifier; time 2.5 ns; voltage 1 V; Integrated circuit modeling; Measurement; Noise; Optimization; Poles and zeros; Polynomials; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (ISCAS), 2012 IEEE International Symposium on
Conference_Location
Seoul
ISSN
0271-4302
Print_ISBN
978-1-4673-0218-0
Type
conf
DOI
10.1109/ISCAS.2012.6271684
Filename
6271684
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