DocumentCode :
3016718
Title :
System-level characterization of single-chip radios for wireless sensor network applications
Author :
He, Yuxin ; Flikkema, Paul G.
Author_Institution :
Dept. of Electr. Eng., Northern Arizona Univ., Flagstaff, AZ, USA
fYear :
2009
fDate :
20-21 April 2009
Firstpage :
1
Lastpage :
5
Abstract :
We tested three single-chip ISM-band radio transceivers with an eye toward communication system-level performance in wireless sensor network applications. We compared the performance of an older-generation chip (Texas Instruments TRF6900A) with two recent chips (Texas Instruments CC1100 and Analog Devices ADF7020). To understand packet-level sensitivity and the potential gains of forward error-control coding, we evaluated the packet error rate and bit error rate statistics as a function of received signal power at two data rates. We characterized features-automatic frequency control, digital received signal strength indication (RSSI), and digital transmit power control-of the two newer chips. We also modeled and evaluated their current consumption and energy efficiency (in terms of per-bit energy use). We found that the new-generation radio chips have significantly higher integration and overall performance, and that radio chip selection for wireless sensor node design is application-dependent. Our work can be used as a design pattern for further testing of additional and future radios for wireless sensor network nodes.
Keywords :
error statistics; wireless sensor networks; Analog Devices ADF7020; ISM-band radio transceivers; Texas Instruments CC1100; Texas Instruments TRF6900A; automatic frequency control; bit error rate statistics; digital received signal strength indication; digital transmit power control; forward error-control coding; older-generation chip; packet error rate statistics; single-chip radios; system-level characterization; wireless sensor network applications; Algorithm design and analysis; Bit error rate; Energy consumption; Energy efficiency; Error analysis; Helium; Instruments; Sensor phenomena and characterization; System testing; Wireless sensor networks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wireless and Microwave Technology Conference, 2009. WAMICON '09. IEEE 10th Annual
Conference_Location :
Clearwater, FL
Print_ISBN :
978-1-4244-4564-6
Electronic_ISBN :
978-1-4244-4565-3
Type :
conf
DOI :
10.1109/WAMICON.2009.5207295
Filename :
5207295
Link To Document :
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