Rapidly characterize structural qualities of large-area graphene by optical anisotropy

We find that optical anisotropy of graphene films which play an important role as an alternative quality factor for the rapid characterization of large-area graphene films. Angle-variable spectroscopy method is developed to rapidly determine the optical anisotropy of graphene films. Unlike other approaches such like Raman scattering spectroscopy, this method allows ready, cheap, and large-area characterization of the structural qualities of CVD graphene films without the application of complicated optical setups.