DocumentCode
3016726
Title
Rapidly characterize structural qualities of large-area graphene by optical anisotropy
Author
Yu-Lun Liu ; Hsuen-Li Chen ; Yu Chen-Chieh ; Cheng-Yi Fang
Author_Institution
Dept. of Mater. Sci. & Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear
2013
fDate
5-8 Aug. 2013
Firstpage
743
Lastpage
746
Abstract
We find that optical anisotropy of graphene films which play an important role as an alternative quality factor for the rapid characterization of large-area graphene films. Angle-variable spectroscopy method is developed to rapidly determine the optical anisotropy of graphene films. Unlike other approaches such like Raman scattering spectroscopy, this method allows ready, cheap, and large-area characterization of the structural qualities of CVD graphene films without the application of complicated optical setups.
Keywords
Raman spectra; chemical vapour deposition; graphene; thin films; C; CVD; Raman scattering spectroscopy; angle-variable spectroscopy; graphene films; optical anisotropy; quality factor; structural qualities; Integrated optics; Optical films; Optical imaging; Optical reflection; Optical refraction; Optical variables measurement; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology (IEEE-NANO), 2013 13th IEEE Conference on
Conference_Location
Beijing
ISSN
1944-9399
Print_ISBN
978-1-4799-0675-8
Type
conf
DOI
10.1109/NANO.2013.6720914
Filename
6720914
Link To Document