DocumentCode :
3016762
Title :
Research on Testability Design of Microwave Module
Author :
Yin Jun ; Xu Yan Feng
Author_Institution :
41st Res. Inst., Nat. Key Lab. of Sci. & Technol. on Electron. Test & Meas., China Electron. Technol. Group Corp., Qingdao, China
fYear :
2010
fDate :
25-27 June 2010
Firstpage :
5535
Lastpage :
5537
Abstract :
In the study, the distributing regularities of microwave module´s faults are obtained combined the module´s feature. The testability design of the microwave module is studied, and especially the module´s testability design of the microwave octave band filter is realized. Finally, some achievements are acquired, including the rapid localization and renovation of the microwave module and even all the electronic system´s faults. All those will play an important part in the testability design of microwave module.
Keywords :
fault diagnosis; microwave integrated circuits; electronic system fault; microwave module; microwave octave band filter; testability design; MMICs; Microwave FET integrated circuits; Microwave circuits; Microwave filters; Microwave measurements; fault diagnosis; microwave module; testability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Control Engineering (ICECE), 2010 International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-6880-5
Type :
conf
DOI :
10.1109/iCECE.2010.1345
Filename :
5631766
Link To Document :
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